Deep Learning Defect Detection

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Recording of Thursday, June 20, 2024 | The smarter E Europe 2024 | Exhibition Program | Language: English | Duration: 14:45 .

Talk of session: Enhanced Characterization Techniques Across Wafer, Cell, and Module Production Lines

Quality assurance in wafer, cell, and module production hinges on efficient characterization processes. Precise measurements and identification of defective products are crucial for cost savings. Characterization enhances throughput and facilitate sorting based on performance metrics, making advancements in software and automation solutions imperative. Machine learning and digitalization play key roles in bolstering the robustness and efficiency of production lines and are widely adopted within the industry. In this session, companies will provide the latest advancements in the realm, while others will showcase how they track the quality of their products. The topic of quality assurance through tracked metrology will be discussed.

Further Talks of this session:

High Speed Cell and Module Quality Inspection Based on Electroluminescence Imaging and AI Optimized Algorithms

To Talk

Innovative Device Characterization Solutions

To Talk

IV-Testing and Tandem/Perovskite: Scaling up from Cell Level to Full Size Module Production

To Talk

VDMA China in a Nutshell

To Talk

Innovations for R&D and End-of-Line Testing

To Talk

LUMI-Q: The New System Platform for Photoluminescence Inspections in Cell and Module Manufacturing

To Talk