Recording of Wednesday, June 14, 2023 | The smarter E Europe | Exhibition Program | Language: English | Duration: 13:05 .

Speaker

Herr Gary Young
Head of Sales

Vitronic Dr. Ing.
Stein Bildverarbeitungs-GmbH

Talk of session: Advancements in Characterization on Production Lines for Wafers, Cells and Modules

Quality control on wafer, cell and module production lines depends on effective characterization. Being able to perform accurate measurements and sorting out any defective products saves costs. Characterization is done through imaging techniques such as infrared, photoluminescence, electroluminescence, and efficiency is determined by current-voltage measurements. We need advancements in software and automation solutions to increase throughput and enable sorting according to performance value. Machine learning and digitalization are widely implemented to make production lines robust and efficient.

Further Talks of this session:

New AI Software for the Fully Automatic Quality Control of Cells and Modules With Minimal Training Effort and Full Control Over the Results at All Times

To Talk

End-of-line Characterization of Colar Cells - An Overview and Outlook

To Talk

Innovative Approaches to Fully Automated Test and Measurement Tasks in PV Module Production

To Talk

Siemens Holistic Support of the Solar PV Industry Along the Entire Value Chain

To Talk

Innovations in End-of-Line Testing and Advanced Analytics

To Talk

Mastering Quality & Yield: Inspection Solutions & Data Analytics for the Entire PV Manufacturing Chain

To Talk